%0 Conference Paper %1 conf/dac/ChenRPR06 %A Chen, Gang %A Reddy, Sudhakar M. %A Pomeranz, Irith %A Rajski, Janusz %B DAC %D 2006 %E Sentovich, Ellen %I ACM %K dblp %P 399-404 %T A test pattern ordering algorithm for diagnosis with truncated fail data. %U http://dblp.uni-trier.de/db/conf/dac/dac2006.html#ChenRPR06 %@ 1-59593-381-6

@inproceedings{conf/dac/ChenRPR06, added-at = {2018-11-06T00:00:00.000+0100}, author = {Chen, Gang and Reddy, Sudhakar M. and Pomeranz, Irith and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/26ad0bc6664eb4b70732212fc4360007a/dblp}, booktitle = {DAC}, crossref = {conf/dac/2006}, editor = {Sentovich, Ellen}, ee = {https://doi.org/10.1145/1146909.1147015}, interhash = {27f6752fed74b5cb796e236a7a19dd07}, intrahash = {6ad0bc6664eb4b70732212fc4360007a}, isbn = {1-59593-381-6}, keywords = {dblp}, pages = {399-404}, publisher = {ACM}, timestamp = {2018-11-07T15:12:24.000+0100}, title = {A test pattern ordering algorithm for diagnosis with truncated fail data.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2006.html#ChenRPR06}, year = 2006 }