%0 Journal Article %1 journals/mr/TyaginovSEJPSOCG11 %A Tyaginov, Stanislav %A Starkov, Ivan A. %A Enichlmair, Hubert %A Jungemann, C. %A Park, Jong Mun %A Seebacher, Ehrenfried %A de Orio, R. L. %A Ceric, Hajdin %A Grasser, Tibor %D 2011 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1525-1529 %T An analytical approach for physical modeling of hot-carrier induced degradation. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#TyaginovSEJPSOCG11 %V 51

@article{journals/mr/TyaginovSEJPSOCG11, added-at = {2021-10-14T00:00:00.000+0200}, author = {Tyaginov, Stanislav and Starkov, Ivan A. and Enichlmair, Hubert and Jungemann, C. and Park, Jong Mun and Seebacher, Ehrenfried and de Orio, R. L. and Ceric, Hajdin and Grasser, Tibor}, biburl = {https://www.bibsonomy.org/bibtex/27e6715921efdd4fd69cde2cac90ae8f8/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.07.089}, interhash = {28ed37965a191bef7d3e5201f9ec42a0}, intrahash = {7e6715921efdd4fd69cde2cac90ae8f8}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1525-1529}, timestamp = {2024-04-09T02:49:59.000+0200}, title = {An analytical approach for physical modeling of hot-carrier induced degradation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#TyaginovSEJPSOCG11}, volume = 51, year = 2011 }