%0 Conference Paper %1 conf/itc/SeguraBRH95 %A Segura, Jaume %A de Benito, Carol %A Rubio, Antonio %A Hawkins, Charles F. %B ITC %D 1995 %I IEEE Computer Society %K dblp %P 544-551 %T A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. %U http://dblp.uni-trier.de/db/conf/itc/itc1995.html#SeguraBRH95 %@ 0-7803-2992-9

@inproceedings{conf/itc/SeguraBRH95, added-at = {2023-07-10T00:00:00.000+0200}, author = {Segura, Jaume and de Benito, Carol and Rubio, Antonio and Hawkins, Charles F.}, biburl = {https://www.bibsonomy.org/bibtex/237bbedfd3844cde1ae028b53848f2da7/dblp}, booktitle = {ITC}, crossref = {conf/itc/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1995.529882}, interhash = {29a266bc7e959a2b61f05f573a1a96e8}, intrahash = {37bbedfd3844cde1ae028b53848f2da7}, isbn = {0-7803-2992-9}, keywords = {dblp}, pages = {544-551}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:30.000+0200}, title = {A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1995.html#SeguraBRH95}, year = 1995 }