%0 Journal Article %1 journals/mr/SimmnacherWHFH03 %A Simmnacher, B. %A Weiland, R. %A Höhne, J. %A v. Feilitzsch, F. %A Hollerith, C. %D 2003 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1675-1680 %T Semiconductor material analysis based on microcalorimeter EDS. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#SimmnacherWHFH03 %V 43

@article{journals/mr/SimmnacherWHFH03, added-at = {2020-02-22T00:00:00.000+0100}, author = {Simmnacher, B. and Weiland, R. and Höhne, J. and v. Feilitzsch, F. and Hollerith, C.}, biburl = {https://www.bibsonomy.org/bibtex/24c4aaa13d114f9f36254c4ebf9e99bf7/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00304-4}, interhash = {29d894b24b5cd78e55d79f7cc29735ae}, intrahash = {4c4aaa13d114f9f36254c4ebf9e99bf7}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1675-1680}, timestamp = {2020-02-25T13:25:44.000+0100}, title = {Semiconductor material analysis based on microcalorimeter EDS.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#SimmnacherWHFH03}, volume = 43, year = 2003 }