%0 Journal Article %1 journals/dt/JunNJLPL17 %A Jun, Hongshin %A Nam, Sang Kyun %A Jin, Han Ho %A Lee, Jong-Chern %A Park, Yong Jae %A Lee, Jaejin %D 2017 %J IEEE Des. Test %K dblp %N 1 %P 16-25 %T High-Bandwidth Memory (HBM) Test Challenges and Solutions. %U http://dblp.uni-trier.de/db/journals/dt/dt34.html#JunNJLPL17 %V 34

@article{journals/dt/JunNJLPL17, added-at = {2020-03-13T00:00:00.000+0100}, author = {Jun, Hongshin and Nam, Sang Kyun and Jin, Han Ho and Lee, Jong-Chern and Park, Yong Jae and Lee, Jaejin}, biburl = {https://www.bibsonomy.org/bibtex/25582978a6fa4eaa2fca7d877532823e5/dblp}, ee = {https://doi.org/10.1109/MDAT.2016.2624283}, interhash = {2b699cb5e5f98a627938bbfb31416f39}, intrahash = {5582978a6fa4eaa2fca7d877532823e5}, journal = {IEEE Des. Test}, keywords = {dblp}, number = 1, pages = {16-25}, timestamp = {2020-03-14T12:05:46.000+0100}, title = {High-Bandwidth Memory (HBM) Test Challenges and Solutions.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt34.html#JunNJLPL17}, volume = 34, year = 2017 }