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%0 Journal Article
%1 journals/mr/SongJKKPKKLK05
%A Song, Yoon-Jong
%A Joo, Heung-Jin
%A Kang, Seung-Kuk
%A Kim, Hyun-Ho
%A Park, Jung-Hoon
%A Kang, Y. M.
%A Kang, E. Y.
%A Lee, Sung-Young
%A Kim, Kinam
%D 2005
%J Microelectron. Reliab.
%K dblp
%N 7-8
%P 1150-1153
%T Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology.
%U http://dblp.uni-trier.de/db/journals/mr/mr45.html#SongJKKPKKLK05
%V 45
@article{journals/mr/SongJKKPKKLK05,
added-at = {2021-10-01T00:00:00.000+0200},
author = {Song, Yoon-Jong and Joo, Heung-Jin and Kang, Seung-Kuk and Kim, Hyun-Ho and Park, Jung-Hoon and Kang, Y. M. and Kang, E. Y. and Lee, Sung-Young and Kim, Kinam},
biburl = {https://www.bibsonomy.org/bibtex/22380f11bc99ee47008604c1b26c60a05/dblp},
ee = {https://doi.org/10.1016/j.microrel.2004.08.014},
interhash = {2c194be6f7a28a28244330557908342c},
intrahash = {2380f11bc99ee47008604c1b26c60a05},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {7-8},
pages = {1150-1153},
timestamp = {2024-04-09T02:49:28.000+0200},
title = {Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#SongJKKPKKLK05},
volume = 45,
year = 2005
}
