%0 Journal Article %1 journals/tcas/PuZIMKTNSS11 %A Pu, Yu %A Zhang, Xin %A Ikeuchi, Katsuyuki %A Muramatsu, Atsushi %A Kawasumi, Atsushi %A Takamiya, Makoto %A Nomura, Masahiro %A Shinohara, Hirofumi %A Sakurai, Takayasu %D 2011 %J IEEE Trans. Circuits Syst. II Express Briefs %K dblp %N 5 %P 294-298 %T Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits. %U http://dblp.uni-trier.de/db/journals/tcas/tcasII58.html#PuZIMKTNSS11 %V 58-II

@article{journals/tcas/PuZIMKTNSS11, added-at = {2020-05-27T00:00:00.000+0200}, author = {Pu, Yu and Zhang, Xin and Ikeuchi, Katsuyuki and Muramatsu, Atsushi and Kawasumi, Atsushi and Takamiya, Makoto and Nomura, Masahiro and Shinohara, Hirofumi and Sakurai, Takayasu}, biburl = {https://www.bibsonomy.org/bibtex/274d8435b05a85134fafc664ed936a546/dblp}, ee = {https://doi.org/10.1109/TCSII.2011.2149050}, interhash = {2c8bf459d2c2e61451fbb61708c939e6}, intrahash = {74d8435b05a85134fafc664ed936a546}, journal = {IEEE Trans. Circuits Syst. II Express Briefs}, keywords = {dblp}, number = 5, pages = {294-298}, timestamp = {2020-05-28T11:55:10.000+0200}, title = {Post-Silicon Clock Deskew Employing Hot-Carrier Injection Trimming With On-Chip Skew Monitoring and Auto-Stressing Scheme for Sub/Near Threshold Digital Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcas/tcasII58.html#PuZIMKTNSS11}, volume = {58-II}, year = 2011 }