%0 Conference Paper %1 conf/ets/LiLCCHWH20 %A Li, Katherine Shu-Min %A Liao, Peter Yi-Yu %A Chou, Leon %A Cheng, Ken Chau-Cheung %A Huang, Andrew Yi-Ann %A Wang, Sying-Jyan %A Han, Gus Chang-Hung %B ETS %D 2020 %I IEEE %K dblp %P 1-6 %T PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques. %U http://dblp.uni-trier.de/db/conf/ets/ets2020.html#LiLCCHWH20 %@ 978-1-7281-4312-5

@inproceedings{conf/ets/LiLCCHWH20, added-at = {2022-10-02T00:00:00.000+0200}, author = {Li, Katherine Shu-Min and Liao, Peter Yi-Yu and Chou, Leon and Cheng, Ken Chau-Cheung and Huang, Andrew Yi-Ann and Wang, Sying-Jyan and Han, Gus Chang-Hung}, biburl = {https://www.bibsonomy.org/bibtex/2458f529d83df1cb49425c63517436a87/dblp}, booktitle = {ETS}, crossref = {conf/ets/2020}, ee = {https://doi.org/10.1109/ETS48528.2020.9131598}, interhash = {2d4c13ffe86674f831152f0087b4c462}, intrahash = {458f529d83df1cb49425c63517436a87}, isbn = {978-1-7281-4312-5}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-10T20:46:06.000+0200}, title = {PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2020.html#LiLCCHWH20}, year = 2020 }