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%0 Journal Article
%1 journals/mr/ZmeckPBOWBNSFB01
%A Zmeck, M.
%A Phang, J. C. H.
%A Bettiol, Andrew
%A Osipowicz, T.
%A Watt, F.
%A Balk, L. J.
%A Niedernostheide, Franz-Josef
%A Schulze, Hans-Joachim
%A Falck, E.
%A Barthelmess, R.
%D 2001
%J Microelectron. Reliab.
%K dblp
%N 9-10
%P 1519-1524
%T Analysis of high-power devices using proton beam induced charge microscopy.
%U http://dblp.uni-trier.de/db/journals/mr/mr41.html#ZmeckPBOWBNSFB01
%V 41
@article{journals/mr/ZmeckPBOWBNSFB01,
added-at = {2020-11-05T00:00:00.000+0100},
author = {Zmeck, M. and Phang, J. C. H. and Bettiol, Andrew and Osipowicz, T. and Watt, F. and Balk, L. J. and Niedernostheide, Franz-Josef and Schulze, Hans-Joachim and Falck, E. and Barthelmess, R.},
biburl = {https://www.bibsonomy.org/bibtex/214e53e853b79d1726b77ff5dbd1d37aa/dblp},
ee = {https://doi.org/10.1016/S0026-2714(01)00159-7},
interhash = {3196e086cf4e02a0eae5e856ca5c1044},
intrahash = {14e53e853b79d1726b77ff5dbd1d37aa},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-10},
pages = {1519-1524},
timestamp = {2020-11-06T11:35:28.000+0100},
title = {Analysis of high-power devices using proton beam induced charge microscopy.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#ZmeckPBOWBNSFB01},
volume = 41,
year = 2001
}