%0 Conference Paper %1 conf/iecon/BrandeleroCMV13 %A Brandelero, Julio %A Cougo, Bernardo %A Meynard, Thierry %A Videau, Nicolas %B IECON %D 2013 %I IEEE %K dblp %P 246-251 %T A non-intrusive method for measuring switching losses of GaN power transistors. %U http://dblp.uni-trier.de/db/conf/iecon/iecon2013.html#BrandeleroCMV13 %@ 978-1-4799-0224-8

@inproceedings{conf/iecon/BrandeleroCMV13, added-at = {2021-04-27T00:00:00.000+0200}, author = {Brandelero, Julio and Cougo, Bernardo and Meynard, Thierry and Videau, Nicolas}, biburl = {https://www.bibsonomy.org/bibtex/2af5161e393463e4c1028b6fc0cb4731b/dblp}, booktitle = {IECON}, crossref = {conf/iecon/2013}, ee = {https://doi.org/10.1109/IECON.2013.6699143}, interhash = {33ccce9611b50b7fcca4b5ca39fc9cce}, intrahash = {af5161e393463e4c1028b6fc0cb4731b}, isbn = {978-1-4799-0224-8}, keywords = {dblp}, pages = {246-251}, publisher = {IEEE}, timestamp = {2024-04-09T17:55:13.000+0200}, title = {A non-intrusive method for measuring switching losses of GaN power transistors.}, url = {http://dblp.uni-trier.de/db/conf/iecon/iecon2013.html#BrandeleroCMV13}, year = 2013 }