%0 Conference Paper %1 conf/itc/ConroyC13 %A Conroy, Zoe %A Crouch, Alfred L. %B ITC %D 2013 %I IEEE Computer Society %K dblp %P 1 %T BA-BIST: Board test from inside the IC out. %U http://dblp.uni-trier.de/db/conf/itc/itc2013.html#ConroyC13 %@ 978-1-4799-0859-2

@inproceedings{conf/itc/ConroyC13, added-at = {2023-03-23T00:00:00.000+0100}, author = {Conroy, Zoe and Crouch, Alfred L.}, biburl = {https://www.bibsonomy.org/bibtex/2d98ab0afbc8102a589e0fbd641a71d56/dblp}, booktitle = {ITC}, crossref = {conf/itc/2013}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2013.6651919}, interhash = {348a6d58092805b4c2d3813bb8c29386}, intrahash = {d98ab0afbc8102a589e0fbd641a71d56}, isbn = {978-1-4799-0859-2}, keywords = {dblp}, pages = 1, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:29:44.000+0200}, title = {BA-BIST: Board test from inside the IC out.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2013.html#ConroyC13}, year = 2013 }