%0 Journal Article %1 journals/tvlsi/TanCD15 %A Tan, Xiao Liang %A Chan, Pak Kwong %A Dasgupta, Uday %D 2015 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 10 %P 2317-2321 %T A Sub-1-V 65-nm MOS Threshold Monitoring-Based Voltage Reference. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi23.html#TanCD15 %V 23

@article{journals/tvlsi/TanCD15, added-at = {2020-03-11T00:00:00.000+0100}, author = {Tan, Xiao Liang and Chan, Pak Kwong and Dasgupta, Uday}, biburl = {https://www.bibsonomy.org/bibtex/25d43fbee613d9c56f6c1ae2b6170463f/dblp}, ee = {https://doi.org/10.1109/TVLSI.2014.2361766}, interhash = {37d6abcffb48330ca3beaa8112be04f0}, intrahash = {5d43fbee613d9c56f6c1ae2b6170463f}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 10, pages = {2317-2321}, timestamp = {2020-03-12T11:44:07.000+0100}, title = {A Sub-1-V 65-nm MOS Threshold Monitoring-Based Voltage Reference.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi23.html#TanCD15}, volume = 23, year = 2015 }