Inproceedings,
Empirical Study on Specification Metrics to Predict Volatility and Software Defects.
T. Tsunoda, H. Washizaki, Y. Fukazawa, S. Inoue, Y. Hanai, and M. Kanazawa.TENCON, page 2479-2484. IEEE, (2018)
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- BibTeX key
- conf/tencon/TsunodaWFIHK18
- entry type
- inproceedings
- booktitle
- TENCON
- year
- 2018
- pages
- 2479-2484
- publisher
- IEEE
- crossref
- conf/tencon/2018
- ee
- https://doi.org/10.1109/TENCON.2018.8650274
- isbn
- 978-1-5386-5457-6
- url
- http://dblp.uni-trier.de/db/conf/tencon/tencon2018.html#TsunodaWFIHK18
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- please select -%0 Conference Paper
%1 conf/tencon/TsunodaWFIHK18
%A Tsunoda, Taketo
%A Washizaki, Hironori
%A Fukazawa, Yoshiaki
%A Inoue, Sakae
%A Hanai, Yoshiiku
%A Kanazawa, Masanobu
%B TENCON
%D 2018
%I IEEE
%K dblp
%P 2479-2484
%T Empirical Study on Specification Metrics to Predict Volatility and Software Defects.
%U http://dblp.uni-trier.de/db/conf/tencon/tencon2018.html#TsunodaWFIHK18
%@ 978-1-5386-5457-6
@inproceedings{conf/tencon/TsunodaWFIHK18,
added-at = {2019-07-30T00:00:00.000+0200},
author = {Tsunoda, Taketo and Washizaki, Hironori and Fukazawa, Yoshiaki and Inoue, Sakae and Hanai, Yoshiiku and Kanazawa, Masanobu},
biburl = {https://www.bibsonomy.org/bibtex/2625ad36cd59a224afbd38183c4809622/dblp},
booktitle = {TENCON},
crossref = {conf/tencon/2018},
ee = {https://doi.org/10.1109/TENCON.2018.8650274},
interhash = {3bb618050ed8e5883ae498acd87e1992},
intrahash = {625ad36cd59a224afbd38183c4809622},
isbn = {978-1-5386-5457-6},
keywords = {dblp},
pages = {2479-2484},
publisher = {IEEE},
timestamp = {2019-10-17T19:59:21.000+0200},
title = {Empirical Study on Specification Metrics to Predict Volatility and Software Defects.},
url = {http://dblp.uni-trier.de/db/conf/tencon/tencon2018.html#TsunodaWFIHK18},
year = 2018
}