%0 Journal Article %1 journals/mr/IwaiO02a %A Iwai, Hiroshi %A Ohmi, S. %D 2002 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1251-1258 %T Trend of CMOS downsizing and its reliability. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#IwaiO02a %V 42

@article{journals/mr/IwaiO02a, added-at = {2020-02-22T00:00:00.000+0100}, author = {Iwai, Hiroshi and Ohmi, S.}, biburl = {https://www.bibsonomy.org/bibtex/24de1776b2a91a8c6bd4e37d8b907085b/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00131-2}, interhash = {3cd6b59eca786b22db5c11a2d823e7e4}, intrahash = {4de1776b2a91a8c6bd4e37d8b907085b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1251-1258}, timestamp = {2020-02-25T13:26:56.000+0100}, title = {Trend of CMOS downsizing and its reliability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#IwaiO02a}, volume = 42, year = 2002 }