%0 Journal Article %1 journals/mr/CastellazziFKH12 %A Castellazzi, Alberto %A Funaki, Tsuyoshi %A Kimoto, Tsunenobu %A Hikihara, Takashi %D 2012 %J Microelectron. Reliab. %K dblp %N 9-10 %P 2414-2419 %T Thermal instability effects in SiC Power MOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#CastellazziFKH12 %V 52

@article{journals/mr/CastellazziFKH12, added-at = {2020-02-22T00:00:00.000+0100}, author = {Castellazzi, Alberto and Funaki, Tsuyoshi and Kimoto, Tsunenobu and Hikihara, Takashi}, biburl = {https://www.bibsonomy.org/bibtex/21ff65f7b5118cd0bab018d076edee075/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.06.096}, interhash = {3de48c018ab1ec86f6c3641a6800bebb}, intrahash = {1ff65f7b5118cd0bab018d076edee075}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {2414-2419}, timestamp = {2020-02-25T13:27:10.000+0100}, title = {Thermal instability effects in SiC Power MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#CastellazziFKH12}, volume = 52, year = 2012 }