%0 Journal Article %1 journals/tim/HoHCLC22 %A Ho, Chao-Ching %A Hernández, Miguel Angel Benalcázar %A Chen, Yi-Fan %A Lin, Chih-Jer %A Chen, Chin-Sheng %D 2022 %J IEEE Trans. Instrum. Meas. %K dblp %P 1-10 %T Deep Residual Neural Network-Based Defect Detection on Complex Backgrounds. %U http://dblp.uni-trier.de/db/journals/tim/tim71.html#HoHCLC22 %V 71

@article{journals/tim/HoHCLC22, added-at = {2022-03-15T00:00:00.000+0100}, author = {Ho, Chao-Ching and Hernández, Miguel Angel Benalcázar and Chen, Yi-Fan and Lin, Chih-Jer and Chen, Chin-Sheng}, biburl = {https://www.bibsonomy.org/bibtex/2f7dfb028aaaefe5d66817c0e82e69944/dblp}, ee = {https://doi.org/10.1109/TIM.2022.3144224}, interhash = {4092d75efd90952c5e5058d3451fb435}, intrahash = {f7dfb028aaaefe5d66817c0e82e69944}, journal = {IEEE Trans. Instrum. Meas.}, keywords = {dblp}, pages = {1-10}, timestamp = {2024-04-08T14:37:18.000+0200}, title = {Deep Residual Neural Network-Based Defect Detection on Complex Backgrounds.}, url = {http://dblp.uni-trier.de/db/journals/tim/tim71.html#HoHCLC22}, volume = 71, year = 2022 }