Inproceedings,
Characterizing artifacts in RR stress test time series.
F. Astudillo-Salinas, K. Palacio-Baus, L. Solano-Quinde, R. Medina, and S. Wong.EMBC, page 692-695. IEEE, (2016)
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- BibTeX key
- conf/embc/Astudillo-Salinas16
- entry type
- inproceedings
- booktitle
- EMBC
- year
- 2016
- pages
- 692-695
- publisher
- IEEE
- crossref
- conf/embc/2016
- ee
- https://www.wikidata.org/entity/Q50858101
- isbn
- 978-1-4577-0220-4
- url
- http://dblp.uni-trier.de/db/conf/embc/embc2016.html#Astudillo-Salinas16
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- please select -%0 Conference Paper
%1 conf/embc/Astudillo-Salinas16
%A Astudillo-Salinas, Fabian
%A Palacio-Baus, Kenneth
%A Solano-Quinde, Lizandro D.
%A Medina, Rubén
%A Wong, Sara
%B EMBC
%D 2016
%I IEEE
%K dblp
%P 692-695
%T Characterizing artifacts in RR stress test time series.
%U http://dblp.uni-trier.de/db/conf/embc/embc2016.html#Astudillo-Salinas16
%@ 978-1-4577-0220-4
@inproceedings{conf/embc/Astudillo-Salinas16,
added-at = {2023-09-30T00:00:00.000+0200},
author = {Astudillo-Salinas, Fabian and Palacio-Baus, Kenneth and Solano-Quinde, Lizandro D. and Medina, Rubén and Wong, Sara},
biburl = {https://www.bibsonomy.org/bibtex/27e249e3ffcdfc17f9aeadd319a4cfce4/dblp},
booktitle = {EMBC},
crossref = {conf/embc/2016},
ee = {https://www.wikidata.org/entity/Q50858101},
interhash = {426721eafb4716bb015937e469559ace},
intrahash = {7e249e3ffcdfc17f9aeadd319a4cfce4},
isbn = {978-1-4577-0220-4},
keywords = {dblp},
pages = {692-695},
publisher = {IEEE},
timestamp = {2024-04-10T04:02:23.000+0200},
title = {Characterizing artifacts in RR stress test time series.},
url = {http://dblp.uni-trier.de/db/conf/embc/embc2016.html#Astudillo-Salinas16},
year = 2016
}