%0 Conference Paper %1 conf/vlsid/PomeranzR06 %A Pomeranz, Irith %A Reddy, Sudhakar M. %B VLSI Design %D 2006 %I IEEE Computer Society %K dblp %P 828-831 %T The Cut Delay Fault Model for Guiding the Generation of n-Detection Test Sets for Transition Faults. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2006.html#PomeranzR06 %@ 0-7695-2502-4

@inproceedings{conf/vlsid/PomeranzR06, added-at = {2023-03-24T00:00:00.000+0100}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/25d0f2f828e31f718562ef85bf6d7fca2/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2006}, ee = {https://doi.ieeecomputersociety.org/10.1109/VLSID.2006.160}, interhash = {4267339f590b489bfabc42a7f6a8949c}, intrahash = {5d0f2f828e31f718562ef85bf6d7fca2}, isbn = {0-7695-2502-4}, keywords = {dblp}, pages = {828-831}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:17:52.000+0200}, title = {The Cut Delay Fault Model for Guiding the Generation of n-Detection Test Sets for Transition Faults.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2006.html#PomeranzR06}, year = 2006 }