%0 Conference Paper %1 conf/socc/SwillamMA13 %A Swillam, Esraa %A Madkour, Kareem %A Anis, Mohab %B SoCC %D 2013 %E Schuhmann, Norbert %E Shi, Kaijian %E Naganathan, Nagi %I IEEE %K dblp %P 43-48 %T Layout regularity metric as a fast indicator of high variability circuits. %U http://dblp.uni-trier.de/db/conf/socc/socc2013.html#SwillamMA13 %@ 978-1-4799-1166-0

@inproceedings{conf/socc/SwillamMA13, added-at = {2018-11-14T00:00:00.000+0100}, author = {Swillam, Esraa and Madkour, Kareem and Anis, Mohab}, biburl = {https://www.bibsonomy.org/bibtex/2b89340d20d2383ed261943fe704c7f41/dblp}, booktitle = {SoCC}, crossref = {conf/socc/2013}, editor = {Schuhmann, Norbert and Shi, Kaijian and Naganathan, Nagi}, ee = {https://www.wikidata.org/entity/Q57186356}, interhash = {42b734eb54d31a06208deda4840114de}, intrahash = {b89340d20d2383ed261943fe704c7f41}, isbn = {978-1-4799-1166-0}, keywords = {dblp}, pages = {43-48}, publisher = {IEEE}, timestamp = {2018-11-15T17:15:57.000+0100}, title = {Layout regularity metric as a fast indicator of high variability circuits.}, url = {http://dblp.uni-trier.de/db/conf/socc/socc2013.html#SwillamMA13}, year = 2013 }