%0 Conference Paper %1 conf/cicc/MakrisOV00 %A Makris, Yiorgos %A Orailoglu, Alex %A Vishakantaiah, Praveen %B CICC %D 2000 %I IEEE %K dblp %P 75-78 %T Modular test generation and concurrent transparency-based test translation using gate-level ATPG. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2000.html#MakrisOV00 %@ 0-7803-5809-0

@inproceedings{conf/cicc/MakrisOV00, added-at = {2022-10-10T00:00:00.000+0200}, author = {Makris, Yiorgos and Orailoglu, Alex and Vishakantaiah, Praveen}, biburl = {https://www.bibsonomy.org/bibtex/29707c09b9d48279eed8ef3e755c120d1/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2000}, ee = {https://doi.org/10.1109/CICC.2000.852621}, interhash = {43034e687c3af8d1c517fdd96fafb7ca}, intrahash = {9707c09b9d48279eed8ef3e755c120d1}, isbn = {0-7803-5809-0}, keywords = {dblp}, pages = {75-78}, publisher = {IEEE}, timestamp = {2024-04-09T19:39:29.000+0200}, title = {Modular test generation and concurrent transparency-based test translation using gate-level ATPG.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2000.html#MakrisOV00}, year = 2000 }