%0 Conference Paper %1 conf/date/FarahmandiMR16 %A Farahmandi, Farimah %A Mishra, Prabhat %A Ray, Sandip %B DATE %D 2016 %E Fanucci, Luca %E Teich, Jürgen %I IEEE %K dblp %P 1477-1480 %T Exploiting transaction level models for observability-aware post-silicon test generation. %U http://dblp.uni-trier.de/db/conf/date/date2016.html#FarahmandiMR16 %@ 978-3-9815-3707-9

@inproceedings{conf/date/FarahmandiMR16, added-at = {2021-08-09T00:00:00.000+0200}, author = {Farahmandi, Farimah and Mishra, Prabhat and Ray, Sandip}, biburl = {https://www.bibsonomy.org/bibtex/2e298602d4621e6528fbae76f21479c9f/dblp}, booktitle = {DATE}, crossref = {conf/date/2016}, editor = {Fanucci, Luca and Teich, Jürgen}, ee = {https://ieeexplore.ieee.org/document/7459544/}, interhash = {436c0d8c2b6c3381b1f0990b827a0661}, intrahash = {e298602d4621e6528fbae76f21479c9f}, isbn = {978-3-9815-3707-9}, keywords = {dblp}, pages = {1477-1480}, publisher = {IEEE}, timestamp = {2024-04-10T06:47:58.000+0200}, title = {Exploiting transaction level models for observability-aware post-silicon test generation.}, url = {http://dblp.uni-trier.de/db/conf/date/date2016.html#FarahmandiMR16}, year = 2016 }