%0 Journal Article %1 journals/et/DavidGLPV02 %A David, René %A Girard, Patrick %A Landrault, Christian %A Pravossoudovitch, Serge %A Virazel, Arnaud %D 2002 %J J. Electron. Test. %K dblp %N 2 %P 145-157 %T Hardware Generation of Random Single Input Change Test Sequences. %U http://dblp.uni-trier.de/db/journals/et/et18.html#DavidGLPV02 %V 18

@article{journals/et/DavidGLPV02, added-at = {2023-03-21T00:00:00.000+0100}, author = {David, René and Girard, Patrick and Landrault, Christian and Pravossoudovitch, Serge and Virazel, Arnaud}, biburl = {https://www.bibsonomy.org/bibtex/2e43d4264ea0b80c6e62dbd3aaabce91c/dblp}, ee = {https://doi.org/10.1023/A:1014941525735}, interhash = {43769fccbdd1d69eb91bdab712e0945f}, intrahash = {e43d4264ea0b80c6e62dbd3aaabce91c}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 2, pages = {145-157}, timestamp = {2024-04-08T20:52:46.000+0200}, title = {Hardware Generation of Random Single Input Change Test Sequences.}, url = {http://dblp.uni-trier.de/db/journals/et/et18.html#DavidGLPV02}, volume = 18, year = 2002 }