%0 Journal Article %1 journals/tvlsi/PomeranzR04 %A Pomeranz, Irith %A Reddy, Sudhakar M. %D 2004 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 7 %P 780-788 %T Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi12.html#PomeranzR04 %V 12

@article{journals/tvlsi/PomeranzR04, added-at = {2020-03-11T00:00:00.000+0100}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2f1a0480b82dd393f10d643331b8c8013/dblp}, ee = {https://doi.org/10.1109/TVLSI.2004.830910}, interhash = {443f87eefde983f8d383d145e57e2fee}, intrahash = {f1a0480b82dd393f10d643331b8c8013}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 7, pages = {780-788}, timestamp = {2020-03-12T11:44:37.000+0100}, title = {Improving the stuck-at fault coverage of functional test sequences by using limited-scan operations.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi12.html#PomeranzR04}, volume = 12, year = 2004 }