%0 Conference Paper %1 conf/itc/DaaschMBC00 %A Daasch, W. Robert %A McNames, James %A Bockelman, Daniel %A Cota, Kevin %B ITC %D 2000 %I IEEE Computer Society %K dblp %P 189-198 %T Variance reduction using wafer patterns in I_ddQ data. %U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#DaaschMBC00 %@ 0-7803-6546-1

@inproceedings{conf/itc/DaaschMBC00, added-at = {2023-03-23T00:00:00.000+0100}, author = {Daasch, W. Robert and McNames, James and Bockelman, Daniel and Cota, Kevin}, biburl = {https://www.bibsonomy.org/bibtex/2711c22e09c92bd1ea062238ca2f592af/dblp}, booktitle = {ITC}, crossref = {conf/itc/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894206}, interhash = {44ff74fbd59ca1121bb038bd5afc368d}, intrahash = {711c22e09c92bd1ea062238ca2f592af}, isbn = {0-7803-6546-1}, keywords = {dblp}, pages = {189-198}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:46.000+0200}, title = {Variance reduction using wafer patterns in I_ddQ data.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#DaaschMBC00}, year = 2000 }