%0 Conference Paper %1 conf/ccece/TrindadeUSP18 %A Trindade, Bruno Machado %A Ukwatta, Eranga %A Spence, Mike %A Pawlowicz, Chris %B CCECE %D 2018 %I IEEE %K dblp %P 1-4 %T Segmentation of Integrated Circuit Layouts from Scan Electron Microscopy Images. %U http://dblp.uni-trier.de/db/conf/ccece/ccece2018.html#TrindadeUSP18 %@ 978-1-5386-2410-4

@inproceedings{conf/ccece/TrindadeUSP18, added-at = {2019-05-05T00:00:00.000+0200}, author = {Trindade, Bruno Machado and Ukwatta, Eranga and Spence, Mike and Pawlowicz, Chris}, biburl = {https://www.bibsonomy.org/bibtex/2322a83608e7b4f78edd968c56d23cee7/dblp}, booktitle = {CCECE}, crossref = {conf/ccece/2018}, ee = {https://doi.org/10.1109/CCECE.2018.8447878}, interhash = {1451f334ab7a88a7f900b79af688f06b}, intrahash = {322a83608e7b4f78edd968c56d23cee7}, isbn = {978-1-5386-2410-4}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2019-05-07T11:37:11.000+0200}, title = {Segmentation of Integrated Circuit Layouts from Scan Electron Microscopy Images.}, url = {http://dblp.uni-trier.de/db/conf/ccece/ccece2018.html#TrindadeUSP18}, year = 2018 }