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%0 Conference Paper
%1 conf/vlsid/IchiharaKIN03
%A Ichihara, Hideyuki
%A Kinoshita, Kozo
%A Isodono, Koji
%A Nishikawa, Shigeki
%B VLSI Design
%D 2003
%I IEEE Computer Society
%K dblp
%P 329-334
%T Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs.
%U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#IchiharaKIN03
%@ 0-7695-1868-0
@inproceedings{conf/vlsid/IchiharaKIN03,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Ichihara, Hideyuki and Kinoshita, Kozo and Isodono, Koji and Nishikawa, Shigeki},
biburl = {https://www.bibsonomy.org/bibtex/2d26f79e08e9d6d6b1743719f2c25677a/dblp},
booktitle = {VLSI Design},
crossref = {conf/vlsid/2003},
ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.2003.1183158},
interhash = {4591287f6e8d05c6ebdf60f2a43352c5},
intrahash = {d26f79e08e9d6d6b1743719f2c25677a},
isbn = {0-7695-1868-0},
keywords = {dblp},
pages = {329-334},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:18:49.000+0200},
title = {Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs.},
url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#IchiharaKIN03},
year = 2003
}