%0 Journal Article %1 journals/jcst/XuLLLH04 %A Xu, Yongjun %A Luo, Zuying %A Li, Xiaowei %A Li, Li-Jian %A Hong, Xianlong %D 2004 %J J. Comput. Sci. Technol. %K dblp %N 5 %P 708-717 %T Leakage Current Estimation of CMOS Circuit with Stack Effect. %U http://dblp.uni-trier.de/db/journals/jcst/jcst19.html#XuLLLH04 %V 19

@article{journals/jcst/XuLLLH04, added-at = {2012-12-06T00:00:00.000+0100}, author = {Xu, Yongjun and Luo, Zuying and Li, Xiaowei and Li, Li-Jian and Hong, Xianlong}, biburl = {https://www.bibsonomy.org/bibtex/2d85186da3dbda30d781b6807a2c82e0e/dblp}, ee = {http://dx.doi.org/10.1007/BF02945598}, interhash = {463bfb06295bc9b9414bd7be15f9ec3f}, intrahash = {d85186da3dbda30d781b6807a2c82e0e}, journal = {J. Comput. Sci. Technol.}, keywords = {dblp}, number = 5, pages = {708-717}, timestamp = {2012-12-07T11:44:53.000+0100}, title = {Leakage Current Estimation of CMOS Circuit with Stack Effect.}, url = {http://dblp.uni-trier.de/db/journals/jcst/jcst19.html#XuLLLH04}, volume = 19, year = 2004 }