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%0 Conference Paper
%1 conf/itc/BarrettMD99
%A Barrett, Norma
%A Martin, Simon
%A Dislis, Chryssa
%B ITC
%D 1999
%I IEEE Computer Society
%K dblp
%P 124-129
%T Test process optimization: closing the gap in the defect spectrum.
%U http://dblp.uni-trier.de/db/conf/itc/itc1999.html#BarrettMD99
%@ 0-7803-5753-1
@inproceedings{conf/itc/BarrettMD99,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Barrett, Norma and Martin, Simon and Dislis, Chryssa},
biburl = {https://www.bibsonomy.org/bibtex/2a6236a9a1d149570b007ab92d0fb233a/dblp},
booktitle = {ITC},
crossref = {conf/itc/1999},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1999.805621},
interhash = {468c605230e894306fd0a9e704a1f42b},
intrahash = {a6236a9a1d149570b007ab92d0fb233a},
isbn = {0-7803-5753-1},
keywords = {dblp},
pages = {124-129},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T19:53:23.000+0200},
title = {Test process optimization: closing the gap in the defect spectrum.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1999.html#BarrettMD99},
year = 1999
}