%0 Conference Paper %1 conf/essderc/ChenRKOC13 %A Chen, Min %A Reddy, Vijay %A Krishnan, Srikanth %A Ondrusek, Jay %A Cao, Yu %B ESSDERC %D 2013 %I IEEE %K dblp %P 182-185 %T ACE: A robust variability and aging sensor for high-k/metal gate SoC. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2013.html#ChenRKOC13

@inproceedings{conf/essderc/ChenRKOC13, added-at = {2021-04-09T00:00:00.000+0200}, author = {Chen, Min and Reddy, Vijay and Krishnan, Srikanth and Ondrusek, Jay and Cao, Yu}, biburl = {https://www.bibsonomy.org/bibtex/2f94f91a3520e01118a733f9e9c4a4074/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2013}, ee = {https://doi.org/10.1109/ESSDERC.2013.6818849}, interhash = {47facaaffcaa0fcff569b0d818d0e40b}, intrahash = {f94f91a3520e01118a733f9e9c4a4074}, keywords = {dblp}, pages = {182-185}, publisher = {IEEE}, timestamp = {2024-04-10T10:01:37.000+0200}, title = {ACE: A robust variability and aging sensor for high-k/metal gate SoC.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2013.html#ChenRKOC13}, year = 2013 }