%0 Journal Article %1 journals/et/SantosGTT02 %A Santos, Marcelino B. %A Gonçalves, Fernando M. %A Teixeira, Isabel C. %A Teixeira, João Paulo %D 2002 %J J. Electron. Test. %K dblp %N 2 %P 179-187 %T RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage. %U http://dblp.uni-trier.de/db/journals/et/et18.html#SantosGTT02 %V 18

@article{journals/et/SantosGTT02, added-at = {2022-09-30T00:00:00.000+0200}, author = {Santos, Marcelino B. and Gonçalves, Fernando M. and Teixeira, Isabel C. and Teixeira, João Paulo}, biburl = {https://www.bibsonomy.org/bibtex/28422d7a95671d47a504bca4f30443526/dblp}, ee = {https://doi.org/10.1023/A:1014997610714}, interhash = {48589f579e891a39bdc7b0914a87a626}, intrahash = {8422d7a95671d47a504bca4f30443526}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 2, pages = {179-187}, timestamp = {2024-04-08T20:52:34.000+0200}, title = {RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage.}, url = {http://dblp.uni-trier.de/db/journals/et/et18.html#SantosGTT02}, volume = 18, year = 2002 }