%0 Conference Paper %1 conf/vts/HalderCVR02 %A Halder, Achintya %A Chatterjee, Abhijit %A Variyam, Pramodchandran N. %A Ridley, John %B VTS %D 2002 %I IEEE Computer Society %K dblp %P 351-356 %T Measuring Stray Capacitance on Tester Hardware. %U http://dblp.uni-trier.de/db/conf/vts/vts2002.html#HalderCVR02 %@ 0-7695-1570-3

@inproceedings{conf/vts/HalderCVR02, added-at = {2023-03-24T00:00:00.000+0100}, author = {Halder, Achintya and Chatterjee, Abhijit and Variyam, Pramodchandran N. and Ridley, John}, biburl = {https://www.bibsonomy.org/bibtex/2006a80fc42af3194fb61521c08d62d29/dblp}, booktitle = {VTS}, crossref = {conf/vts/2002}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTS.2002.1011164}, interhash = {491f482188c9ae35c2ae940778ff3356}, intrahash = {006a80fc42af3194fb61521c08d62d29}, isbn = {0-7695-1570-3}, keywords = {dblp}, pages = {351-356}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:45:28.000+0200}, title = {Measuring Stray Capacitance on Tester Hardware.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2002.html#HalderCVR02}, year = 2002 }