%0 Journal Article %1 journals/ieicet/IchikawaTSTIN08 %A Ichikawa, Kouji %A Takahashi, Yuki %A Sakurai, Yukihiko %A Tsuda, Takahiro %A Iwase, Isao %A Nagata, Makoto %D 2008 %J IEICE Trans. Electron. %K dblp %N 6 %P 936-944 %T Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet91c.html#IchikawaTSTIN08 %V 91-C

@article{journals/ieicet/IchikawaTSTIN08, added-at = {2020-04-11T00:00:00.000+0200}, author = {Ichikawa, Kouji and Takahashi, Yuki and Sakurai, Yukihiko and Tsuda, Takahiro and Iwase, Isao and Nagata, Makoto}, biburl = {https://www.bibsonomy.org/bibtex/276af9a5d1a63117c6e9aa9ee9724b977/dblp}, ee = {https://doi.org/10.1093/ietele/e91-c.6.936}, interhash = {4966d7299acf9031fb0e2cecfb59397f}, intrahash = {76af9a5d1a63117c6e9aa9ee9724b977}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 6, pages = {936-944}, timestamp = {2020-04-14T12:02:33.000+0200}, title = {Measurement-Based Analysis of Electromagnetic Immunity in LSI Circuit Operation.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet91c.html#IchikawaTSTIN08}, volume = {91-C}, year = 2008 }