%0 Conference Paper %1 conf/itc/Kulp96 %A Kulp, Barry D. %B ITC %D 1996 %I IEEE Computer Society %K dblp %P 104-111 %T Testing and Characterizing Jitter in 100BASE-TX and 155.52 Mbit/S ATM Devices with a 1 Gsample/s AWG in an ATE System. %U http://dblp.uni-trier.de/db/conf/itc/itc1996.html#Kulp96 %@ 0-7803-3541-4

@inproceedings{conf/itc/Kulp96, added-at = {2023-03-23T00:00:00.000+0100}, author = {Kulp, Barry D.}, biburl = {https://www.bibsonomy.org/bibtex/233177069d9263c884da786befda25173/dblp}, booktitle = {ITC}, crossref = {conf/itc/1996}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1996.557019}, interhash = {499bdfc7405c4a6348306bd33a6e7b15}, intrahash = {33177069d9263c884da786befda25173}, isbn = {0-7803-3541-4}, keywords = {dblp}, pages = {104-111}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:20.000+0200}, title = {Testing and Characterizing Jitter in 100BASE-TX and 155.52 Mbit/S ATM Devices with a 1 Gsample/s AWG in an ATE System.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1996.html#Kulp96}, year = 1996 }