%0 Journal Article %1 journals/et/FeigePWTK99 %A Feige, Chris %A Pierick, Jan Ten %A Wouters, Clemens %A Tangelder, Ronald J. W. T. %A Kerkhoff, Hans G. %D 1999 %J J. Electron. Test. %K dblp %N 1-2 %P 125-131 %T Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. %U http://dblp.uni-trier.de/db/journals/et/et14.html#FeigePWTK99 %V 14

@article{journals/et/FeigePWTK99, added-at = {2020-09-11T00:00:00.000+0200}, author = {Feige, Chris and Pierick, Jan Ten and Wouters, Clemens and Tangelder, Ronald J. W. T. and Kerkhoff, Hans G.}, biburl = {https://www.bibsonomy.org/bibtex/2261d0f5b0897b7b87d31c64a8ae1a54a/dblp}, ee = {https://doi.org/10.1023/A:1008313726031}, interhash = {49dc2f3c2304374789ac6fbcb20d0b18}, intrahash = {261d0f5b0897b7b87d31c64a8ae1a54a}, journal = {J. Electron. Test.}, keywords = {dblp}, number = {1-2}, pages = {125-131}, timestamp = {2020-09-12T11:41:47.000+0200}, title = {Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach.}, url = {http://dblp.uni-trier.de/db/journals/et/et14.html#FeigePWTK99}, volume = 14, year = 1999 }