%0 Conference Paper %1 conf/eurodac/RudnickHSP94 %A Rudnick, Elizabeth M. %A Holm, John G. %A Saab, Daniel G. %A Patel, Janak H. %B EDAC-ETC-EUROASIC %D 1994 %E Werner, Robert %I IEEE Computer Society %K dblp %P 40-45 %T Application of Simple Genetic Algorithms to Sequential Circuit Test Generation. %U http://dblp.uni-trier.de/db/conf/eurodac/eurodac1994.html#RudnickHSP94 %@ 0-8186-5410-4

@inproceedings{conf/eurodac/RudnickHSP94, added-at = {2017-05-24T00:00:00.000+0200}, author = {Rudnick, Elizabeth M. and Holm, John G. and Saab, Daniel G. and Patel, Janak H.}, biburl = {https://www.bibsonomy.org/bibtex/2ccc2bd3705ddd0d44f082f7a4766d0da/dblp}, booktitle = {EDAC-ETC-EUROASIC}, crossref = {conf/eurodac/1994edac}, editor = {Werner, Robert}, ee = {https://doi.org/10.1109/EDTC.1994.326901}, interhash = {4c4c3ee78b45f91efccfddef592d41b1}, intrahash = {ccc2bd3705ddd0d44f082f7a4766d0da}, isbn = {0-8186-5410-4}, keywords = {dblp}, pages = {40-45}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T22:26:24.000+0200}, title = {Application of Simple Genetic Algorithms to Sequential Circuit Test Generation.}, url = {http://dblp.uni-trier.de/db/conf/eurodac/eurodac1994.html#RudnickHSP94}, year = 1994 }