%0 Journal Article %1 journals/jim/SahnounBBT16 %A Sahnoun, M'hammed %A Bettayeb, Belgacem %A Bassetto, Samuel %A Tollenaere, Michel %D 2016 %J J. Intell. Manuf. %K dblp %N 6 %P 1335-1349 %T Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing. %U http://dblp.uni-trier.de/db/journals/jim/jim27.html#SahnounBBT16 %V 27

@article{journals/jim/SahnounBBT16, added-at = {2023-11-12T00:00:00.000+0100}, author = {Sahnoun, M'hammed and Bettayeb, Belgacem and Bassetto, Samuel and Tollenaere, Michel}, biburl = {https://www.bibsonomy.org/bibtex/24a9efdf14c46e5e3c63f0249783d0d98/dblp}, ee = {https://doi.org/10.1007/s10845-014-0956-x}, interhash = {4c8b77effa7a77f0f664d0946f07cfdf}, intrahash = {4a9efdf14c46e5e3c63f0249783d0d98}, journal = {J. Intell. Manuf.}, keywords = {dblp}, number = 6, pages = {1335-1349}, timestamp = {2024-04-08T19:20:59.000+0200}, title = {Simulation-based optimization of sampling plans to reduce inspections while mastering the risk exposure in semiconductor manufacturing.}, url = {http://dblp.uni-trier.de/db/journals/jim/jim27.html#SahnounBBT16}, volume = 27, year = 2016 }