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%0 Journal Article
%1 journals/mr/WrachienCLMDSTM14
%A Wrachien, Nicola
%A Cester, Andrea
%A Lago, Nicolò
%A Meneghesso, Gaudenzio
%A D'Alpaos, Riccardo
%A Stefani, Andrea
%A Turatti, Guido
%A Muccini, Michele
%D 2014
%J Microelectron. Reliab.
%K dblp
%N 9-10
%P 1638-1642
%T Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states.
%U http://dblp.uni-trier.de/db/journals/mr/mr54.html#WrachienCLMDSTM14
%V 54
@article{journals/mr/WrachienCLMDSTM14,
added-at = {2020-10-26T00:00:00.000+0100},
author = {Wrachien, Nicola and Cester, Andrea and Lago, Nicolò and Meneghesso, Gaudenzio and D'Alpaos, Riccardo and Stefani, Andrea and Turatti, Guido and Muccini, Michele},
biburl = {https://www.bibsonomy.org/bibtex/203cb48f87f7e151c284b7bbe4ea02381/dblp},
ee = {https://doi.org/10.1016/j.microrel.2014.07.065},
interhash = {151069936fe0028da982603e051be25b},
intrahash = {03cb48f87f7e151c284b7bbe4ea02381},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-10},
pages = {1638-1642},
timestamp = {2020-10-27T12:44:45.000+0100},
title = {Stress-induced degradation of p- and n-type organic thin-film-transistors in the ON and OFF states.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#WrachienCLMDSTM14},
volume = 54,
year = 2014
}