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%0 Journal Article
%1 journals/mr/EsselyBGBWDPTL04
%A Essely, Fabien
%A Bestory, Corinne
%A Guitard, Nicolas
%A Bafleur, Marise
%A Wislez, A.
%A Doche, E.
%A Perdu, Philippe
%A Touboul, André
%A Lewis, Dean
%D 2004
%J Microelectron. Reliab.
%K dblp
%N 9-11
%P 1811-1815
%T Study of the ESD defects impact on ICs reliability.
%U http://dblp.uni-trier.de/db/journals/mr/mr44.html#EsselyBGBWDPTL04
%V 44
@article{journals/mr/EsselyBGBWDPTL04,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Essely, Fabien and Bestory, Corinne and Guitard, Nicolas and Bafleur, Marise and Wislez, A. and Doche, E. and Perdu, Philippe and Touboul, André and Lewis, Dean},
biburl = {https://www.bibsonomy.org/bibtex/2f5c1e763fb810e6e60e235ea3a262550/dblp},
ee = {https://doi.org/10.1016/j.microrel.2004.07.090},
interhash = {52ff122a31cf803713233816c2329835},
intrahash = {f5c1e763fb810e6e60e235ea3a262550},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {9-11},
pages = {1811-1815},
timestamp = {2020-02-25T13:27:10.000+0100},
title = {Study of the ESD defects impact on ICs reliability.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#EsselyBGBWDPTL04},
volume = 44,
year = 2004
}