%0 Conference Paper %1 conf/iolts/UemuraTTS08 %A Uemura, Taiki %A Tanabe, Ryo %A Tosaka, Yoshiharu %A Satoh, Shigeo %B IOLTS %D 2008 %I IEEE Computer Society %K dblp %P 117-122 %T Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs. %U http://dblp.uni-trier.de/db/conf/iolts/iolts2008.html#UemuraTTS08 %@ 978-0-7695-3264-6

@inproceedings{conf/iolts/UemuraTTS08, added-at = {2023-03-23T00:00:00.000+0100}, author = {Uemura, Taiki and Tanabe, Ryo and Tosaka, Yoshiharu and Satoh, Shigeo}, biburl = {https://www.bibsonomy.org/bibtex/254c0c690cfbb6e95a4b0d00a826fffd8/dblp}, booktitle = {IOLTS}, crossref = {conf/iolts/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/IOLTS.2008.28}, interhash = {543c9abe4318d1c601147b7585347c38}, intrahash = {54c0c690cfbb6e95a4b0d00a826fffd8}, isbn = {978-0-7695-3264-6}, keywords = {dblp}, pages = {117-122}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T10:50:50.000+0200}, title = {Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs.}, url = {http://dblp.uni-trier.de/db/conf/iolts/iolts2008.html#UemuraTTS08}, year = 2008 }