%0 Journal Article %1 journals/mr/El-MalehO14 %A El-Maleh, Aiman H. %A Oughali, Feras Chikh %D 2014 %J Microelectron. Reliab. %K dblp %N 1 %P 316-326 %T A generalized modular redundancy scheme for enhancing fault tolerance of combinational circuits. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#El-MalehO14 %V 54

@article{journals/mr/El-MalehO14, added-at = {2021-10-14T00:00:00.000+0200}, author = {El-Maleh, Aiman H. and Oughali, Feras Chikh}, biburl = {https://www.bibsonomy.org/bibtex/24e449062218d91dc12ca43c092bb5d44/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.09.002}, interhash = {54daf52aa23ce7603fe4febe2ee954ec}, intrahash = {4e449062218d91dc12ca43c092bb5d44}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {316-326}, timestamp = {2024-04-09T02:49:13.000+0200}, title = {A generalized modular redundancy scheme for enhancing fault tolerance of combinational circuits.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#El-MalehO14}, volume = 54, year = 2014 }