%0 Journal Article %1 journals/tcad/LiXLXCJJ16 %A Li, Tianjian %A Xie, Feng %A Liang, Xiaoyao %A Xu, Qiang %A Chakrabarty, Krishnendu %A Jing, Naifeng %A Jiang, Li %D 2016 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 7 %P 1192-1205 %T A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs. %U http://dblp.uni-trier.de/db/journals/tcad/tcad35.html#LiXLXCJJ16 %V 35

@article{journals/tcad/LiXLXCJJ16, added-at = {2023-03-21T00:00:00.000+0100}, author = {Li, Tianjian and Xie, Feng and Liang, Xiaoyao and Xu, Qiang and Chakrabarty, Krishnendu and Jing, Naifeng and Jiang, Li}, biburl = {https://www.bibsonomy.org/bibtex/257dcb6566567b9f52cce250420e01e51/dblp}, ee = {https://doi.org/10.1109/TCAD.2015.2512909}, interhash = {5603ddfd2a6237638532eb6046001ff9}, intrahash = {57dcb6566567b9f52cce250420e01e51}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 7, pages = {1192-1205}, timestamp = {2024-04-08T19:45:30.000+0200}, title = {A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad35.html#LiXLXCJJ16}, volume = 35, year = 2016 }