%0 Conference Paper %1 conf/iccad/TsaiYLN08 %A Tsai, Kuen-Yu %A You, Meng-Fu %A Lu, Yi-Chang %A Ng, Philip C. W. %B ICCAD %D 2008 %E Nassif, Sani R. %E Roychowdhury, Jaijeet S. %I IEEE Computer Society %K dblp %P 286-291 %T A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2008.html#TsaiYLN08 %@ 978-1-4244-2820-5

@inproceedings{conf/iccad/TsaiYLN08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Tsai, Kuen-Yu and You, Meng-Fu and Lu, Yi-Chang and Ng, Philip C. W.}, biburl = {https://www.bibsonomy.org/bibtex/23f3095808eba79a8c0819769e439de35/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2008}, editor = {Nassif, Sani R. and Roychowdhury, Jaijeet S.}, ee = {https://dl.acm.org/citation.cfm?id=1509525}, interhash = {5678915b747f8e09f5ae36e4d2ff0f3d}, intrahash = {3f3095808eba79a8c0819769e439de35}, isbn = {978-1-4244-2820-5}, keywords = {dblp}, pages = {286-291}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T17:54:13.000+0200}, title = {A new method to improve accuracy of leakage current estimation for transistors with non-rectangular gates due to sub-wavelength lithography effects.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2008.html#TsaiYLN08}, year = 2008 }