%0 Conference Paper %1 conf/vts/SyllaSKHV98 %A Sylla, Iboun Taimiya %A Slamani, Mustapha %A Kaminska, Bozena %A Hossein, Fartoumi M. %A Vincent, Patrick %B VTS %D 1998 %I IEEE Computer Society %K dblp %P 239-244 %T Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. %U http://dblp.uni-trier.de/db/conf/vts/vts1998.html#SyllaSKHV98 %@ 0-8186-8436-4

@inproceedings{conf/vts/SyllaSKHV98, added-at = {2023-03-24T00:00:00.000+0100}, author = {Sylla, Iboun Taimiya and Slamani, Mustapha and Kaminska, Bozena and Hossein, Fartoumi M. and Vincent, Patrick}, biburl = {https://www.bibsonomy.org/bibtex/297af1578e4d63e5460cc6e1c53f01019/dblp}, booktitle = {VTS}, crossref = {conf/vts/1998}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1998.670875}, interhash = {57e01efc5a993438702e94746ef70abd}, intrahash = {97af1578e4d63e5460cc6e1c53f01019}, isbn = {0-8186-8436-4}, keywords = {dblp}, pages = {239-244}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:39.000+0200}, title = {Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1998.html#SyllaSKHV98}, year = 1998 }