%0 Conference Paper %1 conf/mtdt/JeeCIP00 %A Jee, Alvin %A Colburn, Jonathon E. %A Irrinki, V. Swamy %A Puri, Mukesh %B MTDT %D 2000 %I IEEE Computer Society %K dblp %P 20-28 %T Optimizing Memory Tests by Analyzing Defect Coverage. %U http://dblp.uni-trier.de/db/conf/mtdt/mtdt2000.html#JeeCIP00 %@ 0-7695-0689-5

@inproceedings{conf/mtdt/JeeCIP00, added-at = {2023-03-24T00:00:00.000+0100}, author = {Jee, Alvin and Colburn, Jonathon E. and Irrinki, V. Swamy and Puri, Mukesh}, biburl = {https://www.bibsonomy.org/bibtex/259adf8281488a45afc5f0562f2fad160/dblp}, booktitle = {MTDT}, crossref = {conf/mtdt/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/MTDT.2000.868611}, interhash = {5928e456fa6122a12a903d487f84040a}, intrahash = {59adf8281488a45afc5f0562f2fad160}, isbn = {0-7695-0689-5}, keywords = {dblp}, pages = {20-28}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T16:54:09.000+0200}, title = {Optimizing Memory Tests by Analyzing Defect Coverage.}, url = {http://dblp.uni-trier.de/db/conf/mtdt/mtdt2000.html#JeeCIP00}, year = 2000 }