%0 Conference Paper %1 conf/irps/MahajanCVRKA21 %A Mahajan, Bikram Kishore %A Chen, Yen-Pu %A Varghese, Dhanoop %A Reddy, Vijay %A Krishnan, Srikanth %A Alam, Muhammad Ashraful %B IRPS %D 2021 %I IEEE %K dblp %P 1-6 %T Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique. %U http://dblp.uni-trier.de/db/conf/irps/irps2021.html#MahajanCVRKA21 %@ 978-1-7281-6893-7

@inproceedings{conf/irps/MahajanCVRKA21, added-at = {2021-05-05T00:00:00.000+0200}, author = {Mahajan, Bikram Kishore and Chen, Yen-Pu and Varghese, Dhanoop and Reddy, Vijay and Krishnan, Srikanth and Alam, Muhammad Ashraful}, biburl = {https://www.bibsonomy.org/bibtex/2ed820aa5ff1b29acea62f5acebbd34a8/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2021}, ee = {https://doi.org/10.1109/IRPS46558.2021.9405224}, interhash = {5bd434cb1cc575fd7126af9f0a03cb0d}, intrahash = {ed820aa5ff1b29acea62f5acebbd34a8}, isbn = {978-1-7281-6893-7}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:55.000+0200}, title = {Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#MahajanCVRKA21}, year = 2021 }