%0 Conference Paper %1 conf/iconac/ChenLWLY18 %A Chen, Haiyong %A Liu, Jiali %A Wang, Shuang %A Liu, Kun %A Yang, Peng %B ICAC %D 2018 %E Ma, Xiandong %I IEEE %K dblp %P 1-6 %T Robust dislocation defects region segmentation for polysilicon wafer image. %U http://dblp.uni-trier.de/db/conf/iconac/iconac2018.html#ChenLWLY18 %@ 978-1-86220-341-9

@inproceedings{conf/iconac/ChenLWLY18, added-at = {2019-09-23T00:00:00.000+0200}, author = {Chen, Haiyong and Liu, Jiali and Wang, Shuang and Liu, Kun and Yang, Peng}, biburl = {https://www.bibsonomy.org/bibtex/2b1fe4f735f65a0ac194c42d70cf74b63/dblp}, booktitle = {ICAC}, crossref = {conf/iconac/2018}, editor = {Ma, Xiandong}, ee = {https://doi.org/10.23919/IConAC.2018.8748994}, interhash = {5d69e2af8fcf41e1456a9c916dad4b13}, intrahash = {b1fe4f735f65a0ac194c42d70cf74b63}, isbn = {978-1-86220-341-9}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T19:17:27.000+0200}, title = {Robust dislocation defects region segmentation for polysilicon wafer image.}, url = {http://dblp.uni-trier.de/db/conf/iconac/iconac2018.html#ChenLWLY18}, year = 2018 }