%0 Journal Article %1 journals/tcad/AyariK94 %A Ayari, Bechir %A Kaminska, Bozena %D 1994 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 3 %P 353-358 %T A new dynamic test vector compaction for automatic test pattern generation. %U http://dblp.uni-trier.de/db/journals/tcad/tcad13.html#AyariK94 %V 13

@article{journals/tcad/AyariK94, added-at = {2020-09-24T00:00:00.000+0200}, author = {Ayari, Bechir and Kaminska, Bozena}, biburl = {https://www.bibsonomy.org/bibtex/282993d11ace6d2254d162f35e43887d9/dblp}, ee = {https://doi.org/10.1109/43.265676}, interhash = {5fdb2a39a503f213ca926b780b0925c5}, intrahash = {82993d11ace6d2254d162f35e43887d9}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 3, pages = {353-358}, timestamp = {2020-09-25T11:45:28.000+0200}, title = {A new dynamic test vector compaction for automatic test pattern generation.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad13.html#AyariK94}, volume = 13, year = 1994 }