%0 Journal Article %1 journals/mr/PearnL05 %A Pearn, Wen Lea %A Liao, Mou-Yuan %D 2005 %J Microelectron. Reliab. %K dblp %N 3-4 %P 739-751 %T Measuring process capability based on CPK with gauge measurement errors. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#PearnL05 %V 45

@article{journals/mr/PearnL05, added-at = {2020-09-18T00:00:00.000+0200}, author = {Pearn, Wen Lea and Liao, Mou-Yuan}, biburl = {https://www.bibsonomy.org/bibtex/2d10e1fae9a9fdf066b9744c7cb461c2e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.09.005}, interhash = {602f45176ff5bd670e96fc184133ccde}, intrahash = {d10e1fae9a9fdf066b9744c7cb461c2e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {3-4}, pages = {739-751}, timestamp = {2020-09-19T11:44:36.000+0200}, title = {Measuring process capability based on CPK with gauge measurement errors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#PearnL05}, volume = 45, year = 2005 }