%0 Conference Paper %1 conf/ats/HiraseF05 %A Hirase, Junichi %A Furukawa, Tatsuya %B Asian Test Symposium %D 2005 %I IEEE Computer Society %K dblp %P 188-193 %T Chip Identification using the Characteristic Dispersion of Transistor. %U http://dblp.uni-trier.de/db/conf/ats/ats2005.html#HiraseF05 %@ 0-7695-2481-8

@inproceedings{conf/ats/HiraseF05, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hirase, Junichi and Furukawa, Tatsuya}, biburl = {https://www.bibsonomy.org/bibtex/28803120157fca06ad67d48f71abae8df/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2005.35}, interhash = {62ad68d4619cee129d080b235abe8c8f}, intrahash = {8803120157fca06ad67d48f71abae8df}, isbn = {0-7695-2481-8}, keywords = {dblp}, pages = {188-193}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:05.000+0200}, title = {Chip Identification using the Characteristic Dispersion of Transistor.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#HiraseF05}, year = 2005 }