%0 Conference Paper %1 conf/vlsi-dat/LinTHC15 %A Lin, Guo-Yu %A Tsai, Kun-Han %A Huang, Jiun-Lang %A Cheng, Wu-Tung %B VLSI-DAT %D 2015 %I IEEE %K dblp %P 1-4 %T A test-application-count based learning technique for test time reduction. %U http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#LinTHC15 %@ 978-1-4799-6275-4

@inproceedings{conf/vlsi-dat/LinTHC15, added-at = {2015-09-28T00:00:00.000+0200}, author = {Lin, Guo-Yu and Tsai, Kun-Han and Huang, Jiun-Lang and Cheng, Wu-Tung}, biburl = {https://www.bibsonomy.org/bibtex/2155a5ddc4480909b5fb966382f82139d/dblp}, booktitle = {VLSI-DAT}, crossref = {conf/vlsi-dat/2015}, ee = {http://dx.doi.org/10.1109/VLSI-DAT.2015.7114507}, interhash = {63d189271f808ca657e246058a42da94}, intrahash = {155a5ddc4480909b5fb966382f82139d}, isbn = {978-1-4799-6275-4}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2015-09-29T11:36:26.000+0200}, title = {A test-application-count based learning technique for test time reduction.}, url = {http://dblp.uni-trier.de/db/conf/vlsi-dat/vlsi-dat2015.html#LinTHC15}, year = 2015 }